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IEC 62076 : 1.0 INDUSTRIAL ELECTROHEATING INSTALLATIONS - TEST METHODS FOR INDUCTION CHANNEL AND INDUCTION CRUCIBLE FURNACES International Electrotechnical Committee
IEC 62471 : 1.0 : 2006 PHOTOBIOLOGICAL SAFETY OF LAMPS AND LAMP SYSTEMS International Electrotechnical Committee
IEC 60749-39 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 39: MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED FOR SEMICONDUCTOR COMPONENTS International Electrotechnical...
IEC 61189-6 : 1.0 TEST METHODS FOR ELECTRICAL MATERIALS, INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 6: TEST METHODS FOR MATERIALS USED IN MANUFACTURING ELECTRONIC ASSEMBLIES International Electrotechnical Committee ...
IEC TS 62229 : 1.0 MULTIMEDIA SYSTEMS AND EQUIPMENT - MULTIMEDIA E-PUBLISHING AND E-BOOK - CONCEPTUAL MODEL FOR MULTIMEDIA E-PUBLISHING International Electrotechnical Committee
IEC 60034-26 : 1.0 ROTATING ELECTRICAL MACHINES - PART 26: EFFECTS OF UNBALANCED VOLTAGES ON THE PERFORMANCE OF THREE-PHASE CAGE INDUCTION MOTORS International Electrotechnical Committee
IEC 62290-1 : 2.0 RAILWAY APPLICATIONS - URBAN GUIDED TRANSPORT MANAGEMENT AND COMMAND/CONTROL SYSTEMS - PART 1: SYSTEM PRINCIPLES AND FUNDAMENTAL CONCEPTS International Electrotechnical Committee
IEC 60884-1 : 3.1:2006 PLUGS AND SOCKET-OUTLETS FOR HOUSEHOLD AND SIMILAR PURPOSES - PART 1: GENERAL REQUIREMENTS International Electrotechnical Committee
IEC 60749-35 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 35: ACOUSTIC MICROSCOPY FOR PLASTIC ENCAPSULATED ELECTRONIC COMPONENTS International Electrotechnical Committee
IEC 62373 : 1.0 BIAS-TEMPERATURE STABILITY TEST FOR METAL-OXIDE, SEMICONDUCTOR, FIELD-EFFECT TRANSISTORS (MOSFET) International Electrotechnical Committee
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