IEC 62373 : 1.0

Table of Contents

FOREWORD
INTRODUCTION
1 Scope
2 Terms and definitions
3 Test equipment
  3.1 Equipment
  3.2 Requirement for handling
4 Test sample
  4.1 Sample
  4.2 Packaging
  4.3 ESD protection circuit
5 Procedure
  5.1 Initial measurement and read point measurement
  5.2 Test
  5.3 Notes for field MOSFET
  5.4 Judgment
Annex A (informative) Wafer level reliability test
        (WLR test)
Bibliography

Abstract

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47