JISThere are 9739 products.

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  JIS K 0148:2005

  JIS K 0148:2005 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy Japanese Standards Association

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  JIS K 7243-1:2005

  JIS K 7243-1:2005 Plastics - Epoxy resins - Determination of chlorine content Part 1: Inorganic chlorine Japanese Standards Association

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  JIS K 0312:2005

  JIS K 0312:2005 Method for determination of tetra-through octachlorodibenzo-p-dioxins, tetra-through octachlorodibenzofurans and dioxin-like polychlorinatedbiphenyls in industrial water and waste water Japanese Standards Association ...

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  JIS K 0311:2005

  JIS K 0311:2005 Method for determination of tetra-through octachlorodibenzo-p-dioxins, tetra-through octachlorodibenzofurans and dioxin-like polychlorinatedbiphenyls in stationary source emissions Japanese Standards Association ...

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  JIS C 9335-2-17:2005

  JIS C 9335-2-17:2005 Household And Similar Electrical Appliances - Safety - Part 2-17: Particular Requirements For Blankets, Pads And Similar Flexible Heating Appliances Japanese Standards Association

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  JIS C 5402-2-1:2005

  JIS C 5402-2-1:2005 Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method Japanese Standards Association ...

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  JIS C 5402-20-2:2005

  JIS C 5402-20-2:2005 Electromechanical components for electronic equipment - Basic testing procedures and measuring methods Part 20-2: Test 20b - Flammability tests - Fireproofness Japanese Standards Association

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  JIS C 5402-2-3:2005

  JIS C 5402-2-3:2005 Connectors for electronic equipment - Tests and measurements Part 2-3: Electrical continuity and contact resistance tests - Test 2c: Contact resistance variation Japanese Standards Association

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  JIS C 1515:2004

  JIS C 1515:2004 Electroacoustics - Sound calibrators Japanese Standards Association

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  JIS C 5402-11-4:2005

  JIS C 5402-11-4:2005 Connectors for electronic equipment - Tests and measurements Part 11-4: Climatic tests - Test 11d: Rapid change of temperature Japanese Standards Association

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