IEC 61967-8 Ed. 2.0 b:2023
IEC 61967-8 Ed. 2.0 b:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
standard by International Electrotechnical Commission , 05/01/2023
Specials
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JIS K 2513:2000
$78.00 (-56%) $34.32
Full Description
This part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
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