Full Description

This part of IEC 60512 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7 [1], IEC 61076-1 [2], IEC 61076-2 [3], IEC 61076-3 [4] and IEC 63171 [5] series of standards for connecting hardware applications from 0,1 MHz up to 2 000 MHz, with reference to this document.

NOTE This document is also suitable for testing signal integrity and transmission performance of connectors up to a lower value of maximum frequency; however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector.

The list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards.

Test procedures provided herein are:
– insertion loss, test 28a;
– return loss, test 28b;
– near-end crosstalk (NEXT) test 28c;
– far-end crosstalk (FEXT), test 28d;
– transverse conversion loss (TCL), test 28f;
– transverse conversion transfer loss (TCTL), test 28g.
Other test procedures referenced herein are:
– shield transfer impedance (ZT), see IEC 60512-26-100, test 26e.
– coupling attenuation (aC), see IEC 62153-4-7 and IEC 62153-4-12.
– low frequency coupling attenuation (aCLF) see IEC 62153-4-7 and IEC 62153-4-15.