SAE HS 784 : 2003
SAE HS 784 : 2003
RESIDUAL STRESS MEASUREMENT BY X-RAY DIFFRACTION
SAE International
Specials
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AS 681.1-2008
$78.00 (-56%) $34.32
Abstract
Purpose is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | SAE International |
