SAE HS 784 : 2003
SAE HS 784 : 2003
RESIDUAL STRESS MEASUREMENT BY X-RAY DIFFRACTION
SAE International
Specials
-
-
JIS B 1168:1994
$78.00 (-56%) $34.32
Abstract
Purpose is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | SAE International |
Cart
(empty)
New products
- EIA-364-79 1998 R2015
- ECIA EIA-364-114:2010 R2017
- ECIA EIA-364-78C
- IEC 62908-12-10 Ed. 2.0 en:2023
- IEC 62471-7 Ed. 1.0 b:2023
- IEC 62087-3 Ed. 2.0 b:2023
- IEC 60332-SER Ed. 1.0 b:2023
- IEC 61970-SER Ed. 1.0 b:2023
- IEC 61158-5-4 Ed. 4.0 b:2023
- IEC 61784-1-3 Ed. 1.0 b:2023
- IEC 61784-1-0 Ed. 1.0 b:2023
- IEC 62769-150-1 Ed. 2.0 b:2023
- IEC 61784-2-21 Ed. 1.0 b:2023
- IEC 63171-7 Ed. 1.0 en:2023
- IEC 63474 Ed. 1.0 b:2023
- IEC 60534-1 Ed. 4.0 b:2023
- IEC 62106-6 Ed. 2.0 en:2023
- IEC 60601-2-46 Ed. 4.0 b:2023
- IEC 60071-2 Ed. 5.0 b:2023
- IEC 61156-11 Ed. 2.0 en:2023