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IEC PAS 62162 : 1.0

IEC PAS 62162 : 1.0

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS

International Electrotechnical Committee

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Table of Contents

FOREWORD
1 Purpose
2 Scope
3 Reference document
4 Terms and definitions
5 Circuit schematic for the CDM simulator
6 Simulator waveform verification
7 Measurement instrumentation
8 Measurement procedure
9 Waveform characteristics
10 Voltage levels
11 Test procedure
12 Failure criteria
13 Supplementary information
Figures

Abstract

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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