SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - SECTIONAL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF THE CAPABILITY APPROVAL PROCEDURES
International Electrotechnical Committee
FOREWORD
1 Scope and object
2 General preferred characteristics, ratings and
severities for environmental tests
2.1 Normative references
2.2 Preferred ratings and characteristics
2.3 Information to be given in a detail specification
3 Capability approval procedures
3.1 Selection of capability qualifying circuits
(CQCs)
3.2 Structural similarity
3.3 Capability approval
3.4 Resubmission of rejected lots (lot-by-lot
inspection)
3.5 Manufacturing stages in a factory of an approved
manufacturer
4 Test and measurement procedures
5 Tables for method B
Annexes
A Structural similarity rules for capability approval
B Minimum contents of a manufacturer's capability manual
for thick film circuits
C Minimum contents of a manufacturer's capability manual
for thin film circuits
Tables
1 Test schedule for capability approval for method A
2 Assessment levels and acceptance criteria for capability
manual for thick film circuits
3 Assessment levels and acceptance criteria for quality
conformance inspection for method A
4 Screening
5 Test schedule for capability approval for method B
6 Assessment levels and acceptance criteria for
capability approval for method B
7 Assessment levels and acceptance criteria for quality
conformance inspection for method B
Applicable to film integrated circuits and hybrid film integrated circuits made as catalogue circuits, or alternatively as custom- built circuits having its quality assessed on the basis of capability approval. Gives preferred values for ratings and characteristics for selection from the generic specification the appropriate tests and measuring methods, in order to give general performance requirements for use in detail specifications for film integrated circuits and hybrid film integrated circuits derived from this specification.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | SC 47A |
| Supersedes |
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