IEC 60261 : 2.0

Table of Contents

FOREWORD<br>PREFACE<br>Clause<br>1. Scope<br>2. Units<br>3. Test method A: Pressure drop during elapsed<br>&nbsp;&nbsp;&nbsp;&nbsp;time (quantity test)<br>&nbsp;&nbsp;&nbsp;&nbsp;3.1 Definitions of terms and symbols<br>&nbsp;&nbsp;&nbsp;&nbsp;3.2 Test procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;3.3 Preferred test conditions<br>&nbsp;&nbsp;&nbsp;&nbsp;3.4 Summary of details which may need to be <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;specified in the relevant specification<br>4. Test method B: Leak rate<br>&nbsp;&nbsp;&nbsp;&nbsp;4.1 Definition, units of terms and symbols<br>&nbsp;&nbsp;&nbsp;&nbsp;4.2 Test apparatus<br>&nbsp;&nbsp;&nbsp;&nbsp;4.3 Test procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;4.4 Summary of details which may need to be <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;specified in the relevant specification<br>&nbsp;&nbsp;&nbsp;&nbsp;4.5 Preferred test conditions<br>5. Test method C: Bubble test (quality test)<br>&nbsp;&nbsp;&nbsp;&nbsp;5.1 Test procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;5.2 Preferred test conditions<br>&nbsp;&nbsp;&nbsp;&nbsp;5.3 Summary of details which may need to be<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;specified in the relevant specification<br>6. Test method D: Halogen leakage test (quality test)<br>7. Test method E: Helium leakage test (quantity and <br>&nbsp;&nbsp;&nbsp;&nbsp;quality test)<br>FIGURE

Abstract

Specifies uniform measuring methods for sealing tests for pressurized waveguide components and assemblies. These measuring methods are carried out with regard to quantity and quality.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	SC 46B