IEC 60444-5 : 1.0

MEASUREMENT OF QUARTZ CRYSTAL UNITS PARAMETERS - PART 5: METHODS FOR THE DETERMINATION OF EQUIVALENT ELECTRICAL PARAMETERS USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION

International Electrotechnical Committee

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FOREWORD PREFACE Clause 1 Scope 2 Introduction   2.1 General   2.2 Methods of admittance measurement   2.3 Admittance analysis and estimation of equivalent        circuit parameters   2.4 Normative references 3 Measurement procedures   3.1 General   3.2 Environmental control   3.3 Calibration   3.4 Level of drive   3.5 C0 measurements   3.6 Choice of measurement frequencies   3.7 Data collection   3.8 Data correction   3.9 Admittance calculation   3.10 Admittance analysis and estimation of the equivalent        circuit parameters 4 Choice of admittance measurement method   4.1 General   4.2 Advantages and disadvantages of the one-port        S-parameter reflection method   4.3 Advantages and disadvantages of the two-port        S-parameter transmission method   4.4 Advantages and disadvantages of the direct        transmission method 5 Calibration techniques   5.1 S-parameter method   5.2 Direct transmission method   5.3 Verification of calibration 6 Low-frequency measurements 7 Admittance analysis and estimation of the equivalent   circuit parameters   7.1 General least-squares fitting method   7.2 Linear least-squares fitting procedure   7.3 Circle-fitting method   7.4 Two-point iterative method 8 Measurement errors, instrumentation and test fixtures   8.1 General comments   8.2 Measurement conditions   8.3 Reproducibility   8.4 Measurement and test fixtures Figures Annexes A Calibration B Low-frequency measurement C Bibliography

Abstract

Provides methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits. Circuit representations are based on electrical parameters measured with vector network analyser equipment using automatic error connection. Determination of the equivalent parameters by the method of this standard is based on the measurement of device immitance in the vicinity of series resonance.