CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 25-3: TEST 25C - RISE TIME DEGRADATION
International Electrotechnical Committee
FOREWORD
1 General
1.1 Scope and object
1.2 Definitions
2 Test resources
2.1 Equipment
2.2 Fixture
2.2.1 Method A, single-ended
2.2.2 Method B, differentially driven
3 Test specimen
3.1 Description
3.1.1 Separable connectors
3.1.2 Cable assembly
3.1.3 Sockets
4 Test procedure
4.1 Insertion technique
4.2 Reference fixture technique
4.3 Rise time degradation calculation
5 Details to be specified
6 Test documentation
Annex A (normative) Diagrams and schematics of fixtures
and equipment
Annex B (informative) Practical guidance
Figure 1 - Waveform
Figure A.1 - Technique diagrams
Figure A.2 - Single-ended terminations
Figure A.3 - Differential (balanced) terminations
Applicable to electrical connectors, sockets, cable assemblies or interconnection systems. Defines a method for measuring the effect a specimen has on the rise time of a signal passing through it.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | SC 48B |
