IEC 60748-11-1 : 1.0

IEC 60748-11-1 : 1.0

SEMICONDUCTOR DEVICES. INTEGRATED CIRCUITS - INTERNAL VISUAL EXAMINATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>Clause<br>1 Scope and object<br>2 Apparatus<br>3 Procedure for integrated circuits<br>&nbsp;&nbsp;3.0 Introduction<br>&nbsp;&nbsp;3.1 Test conditions<br>&nbsp;&nbsp;3.2 Specified conditions<br>Figures

Abstract

This publication also bears the number QC 790101 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee SC 47A
Supersedes
  • IEC 60148B : 1979

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