SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR MOS ULTRAVIOLET LIGHT ERASABLE ELECTRICALLY PROGRAMMABLE READ-ONLY MEMORIES
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Marking and ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating
temperature range)
6 Electrical characteristics
7 Programming
8 Mechanical and climatic ratings, characteristics and data
9 Additional information
10 Screening
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement method
Annex A (normative) Programming and erasing
One of a series of blank detail specification for semiconductor devices to be used with the following publications: IEC 747-10: Semiconductor devices - Discrete devices and integrated circuits - part 10: Generic specification for discrete devices and integrated circuits and IEC 748-11: Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | SC 47A |
| Supersedes |
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