IEC 61164 : 2.0
IEC 61164 : 2.0
RELIABILITY GROWTH - STATISTICAL TEST AND ESTIMATION METHODS
International Electrotechnical Committee
Table of Contents
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols
5 Reliability growth models in design and test
6 Reliability growth models used for systems/products
in design phase
7 Reliability growth planning a tracking in the product
reliability growth testing
8 Use of the power law model in planning reliability
improvement test programmes
9 Statistical test and estimation procedures for continuous
power law model
Annex A (informative) - Examples for planning and analytical
models used in design and test phase of product
development
Annex B (informative) - The power law reliability growth model
- Background information
Bibliography
Abstract
Gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 56 |
