PROCESS MEASUREMENT AND CONTROL DEVICES - GENERAL METHODS AND PROCEDURES FOR EVALUATING PERFORMANCE - PART 3: TESTS FOR THE EFFECTS OF INFLUENCE QUANTITIES
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General considerations
4.1 Criteria
4.2 General procedures
4.3 General EMC requirements
5 Ambient temperature effects
5.1 Criteria
5.2 Test procedure
6 Ambient relative humidity effects
7 Vibration
7.1 General considerations
7.2 Initial resonance search
7.3 Endurance conditioning by sweeping
7.4 Final resonance search
7.5 Final measurements
8 Shock, drop and topple
9 Mounting position
10 Over-range
11 Output load effects
11.1 Electrical output
11.2 Pneumatic output
12 Power supply
12.1 Supply voltage and frequency variations
12.2 Transient supply voltage effects
12.3 Supply voltage depression
12.4 Short-term supply voltage interruptions
12.5 Fast transient/burst immunity requirements
12.6 Surge immunity requirements
12.7 Reverse supply voltage protection (d.c. devices)
12.8 Supply pressure variations
12.9 Supply pressure interruptions
12.10 Conducted radio frequency requirements
13 Superimposed voltages
13.1 Line to earth voltages
13.2 Line to line voltages (series mode)
13.3 Earthing
14 Harmonic distortion effects
15 Magnetic field effects
16 Electromagnetic field immunity test
17 Electrostatic discharge
18 Effect of open-circuited and short-circuited input
19 Effect of open-circuited and short-circuited output
20 Effects of process medium conditions
20.1 Temperature of process fluid
20.2 Flow of process fluid through the device
20.3 Static line pressure effect
21 Atmospheric pressure effects
22 Flow of purge gas through the device
23 Accelerated operational life test
24 Operational long-term drift test (optional)
Bibliography
Describes general methods and procedures for conducting tests and reporting on the functional and performance characteristics of process measurement and control devices.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 65 |
