IEC 61580-3 : 1.0

Table of Contents

Contents<br>Foreword<br>Clause<br>1. Scope and object<br>2. General<br>3. Principle<br>4. Test set-up<br>&nbsp;&nbsp;&nbsp;&nbsp;4.1 Test set-up 1<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.1.1 Test equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.1.2 Procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.1.3 Expression of results<br>&nbsp;&nbsp;&nbsp;&nbsp;4.2 Test set-up 2<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.2.1 Test equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.2.2 Procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.2.3 Expression of results<br>5. Requirements<br>Figures<br>1. Test set-up 1<br>2. Test set-up 2

Abstract

Applicable to the variation of group delay of a wave propagated in waveguide or waveguide assemblies. The aim of the test procedure given is to characterize the group delay variation of a wave propagated in waveguide or waveguide assemblies.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 46