SUPERCONDUCTIVITY - PART 7: ELECTRONIC CHARACTERISTIC MEASUREMENTS - SURFACE RESISTANCE OF SUPERCONDUCTORS AT MICROWAVE FREQUENCIES
International Electrotechnical Committee
FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Requirements<br>5 Apparatus<br> 5.1 Measurement system<br> 5.2 Measurement apparatus for R[s]<br> 5.3 Dielectric rods<br>6 Measurement procedure<br> 6.1 Specimen preparation<br> 6.2 Set-up<br> 6.3 Measurement of reference level<br> 6.4 Measurement of the frequency response of resonators<br> 6.5 Determination of surface resistance of the <br> superconductor and epsilon and tan delta of the <br> standard sapphire rods<br>7 Precision and accuracy of the test method<br> 7.1 Surface resistance<br> 7.2 Temperature<br> 7.3 Specimen and holder support structure<br> 7.4 Specimen protection<br>8 Test report<br> 8.1 Identification of test specimen<br> 8.2 Report of R[s] values<br> 8.3 Report of test conditions<br>Annex A (informative) Additional information <br> relating to Clauses 1 to 8<br>Bibliography
Describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of R[s] at the resonant frequency.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 90 |
