IEC 60749-3 : 2.0
IEC 60749-3 : 2.0
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
International Electrotechnical Committee
Specials
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AS/NZS 4266.1:2017
$78.00 (-56%) $34.32
Table of Contents
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Test apparatus<br>5 Procedure<br>6 Failure criteria<br>7 Summary<br>Annex A (informative) - External visual report<br> form/checklist (example only - not a<br> mandatory template)<br>Bibliography
Abstract
Aims to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
| Supersedes |
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