IEC 60749-13 : 2.0

Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography

Abstract

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47