IEC 60749-9 : 2.0
IEC 60749-9 : 2.0
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING
International Electrotechnical Committee
Specials
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AS/NZS 1301.439s:2007
$78.00 (-56%) $34.32
Table of Contents
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Equipment<br>5 Safety precautions<br>6 Procedure<br>7 Failure criteria<br>8 Summary<br>Bibliography
Abstract
Aims to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
| Supersedes |
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