IEC 60749-1 : 1.0

Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and letter symbols<br>4 Standard atmospheric conditions<br>5 Electrical measurements<br>6 Use of electrically defective devices

Abstract

Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47