IEC 60749-32 : 1.1

IEC 60749-32 : 1.1

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

International Electrotechnical Committee

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Table of Contents

FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test Procedure

Abstract

Applies to semiconductor devices (discrete devices and integrated circuits).

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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