Home>IEC 60749-36 : 1.0

IEC 60749-36 : 1.0

IEC 60749-36 : 1.0

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE

International Electrotechnical Committee

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$31.20

$78.00

(price reduced by 60 %)

Table of Contents

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary

Abstract

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

Contact us