IEC 60749-36 : 1.0
IEC 60749-36 : 1.0
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
International Electrotechnical Committee
Table of Contents
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Abstract
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
