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IEC 60749-29 : 2.0

IEC 60749-29 : 2.0

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>1 Scope and object <br>2 Terms and definitions<br>3 Classification and levels<br>4 Apparatus and material <br>5 Procedure <br>6 Failure criteria <br>7 Summary <br>Annex A (informative) - Examples of special pins that are <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;connected to passive components <br>Annex B (informative) - Calculation of operating ambient <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;or operating case temperature for a given operating <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;junction temperature

Abstract

Covers the I-test and the overvoltage latch-up testing of integrated circuits.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47
Supersedes
  • IEC PAS 62181 : 1.0

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