SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
International Electrotechnical Committee
FOREWORD<br>1 Scope and object<br>2 Normative references <br>3 Test apparatus<br>4 General requirements <br>5 Test conditions <br>6 Procedure <br>7 Failure criteria <br>8 Safety <br>9 Summary
Specifies the unbiased highly accelerated stress testing (HAST) which is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
| Supersedes |
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