CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 25-6: TEST 25F: EYE PATTERN AND JITTER
International Electrotechnical Committee
FOREWORD
1 Introduction
1.1 Scope
1.2 Terms and definitions
2 Test resources
2.1 Equipment
2.2 Fixture
3 Test specimen
3.1 Description
4 Test procedure
4.1 General
4.2 Eye pattern
4.3 Jitter
5 Details to be specified
6 Test documentation
Annex A (normative) Schematics of sample termination
Annex B (informative) Eye pattern interpretation - Practical
guidance
Figures
Applies to electrical connectors, cable assemblies, or interconnection systems within the scope of IEC TC 48. Describes methods for measuring an eye pattern response and jitter in the time domain.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 48 |
