INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4-1: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD - APPLICATION GUIDANCE TO IEC 61967-4
International Electrotechnical Committee
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Splitting ICs into IC function modules<br> 4.1 Background<br> 4.2 Benefits<br> 4.3 IC function modules<br> 4.4 Example matrix for splitting ICs into IC function <br> modules<br>5 Workflow to perform IC EMC emission tests<br> 5.1 Emission test philosophy<br> 5.2 Flowchart of performing emission tests<br>6 Test configurations for IC function modules<br> 6.1 EMC test recommendations for IC function modules<br> 6.2 Port selection guide<br> 6.3 Test networks at selected ports<br> 6.4 Supply selection guide<br> 6.5 Test networks at selected supplies<br> 6.6 Parameter initialization of IC function modules <br> for testing<br> 6.7 Test parameter for performing conducted emission <br> measurements<br>7 Test board layout recommendations<br> 7.1 Common test board recommendations<br> 7.2 150 ohm network on 2 layer and multi layer PCB<br> 7.3 1 ohm network on 2 layer and multi-layer PCB<br>8 Test report<br>Annex A (normative) IEC 61967-4 test network modification<br>Annex B (informative) Trace impedance calculation<br>Annex C (informative) Examples for splitting ICs into IC <br> function modules<br>Figures
Acts as an application guidance and relates to IEC 61967-4. Provides advice for performing test methods by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
