IEC 62044-2 : 1.0

Table of Contents

FOREWORD<br>1 Scope and object<br>2 Normative references<br>3 Definitions<br>4 Symbols<br>5 Environmental conditions<br>6 General precautions for methods involving permeability<br>&nbsp;&nbsp;&nbsp;measurements<br>&nbsp;&nbsp;&nbsp;6.1 Parameters involved<br>&nbsp;&nbsp;&nbsp;6.2 Mounting of cores consisting of more than one part<br>7 General precautions for loss measurement at low flux density<br>&nbsp;&nbsp;&nbsp;7.1 Contributory losses<br>&nbsp;&nbsp;&nbsp;7.2 Mounting<br>8 Magnetic conditioning<br>9 Inductance measurement<br>&nbsp;&nbsp;&nbsp;9.1 General<br>&nbsp;&nbsp;&nbsp;9.2 Determination of the test signal<br>&nbsp;&nbsp;&nbsp;9.3 Determination of the test coil<br>&nbsp;&nbsp;&nbsp;9.4 Considerations for core alignment during test<br>&nbsp;&nbsp;&nbsp;9.5 Measurement of inductance under the influence of<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;d.c. magnetic field<br>&nbsp;&nbsp;&nbsp;9.6 Parameters related to core geometry<br>&nbsp;&nbsp;&nbsp;9.7 Magnetic material parameters<br>10 Disaccommodation<br>11 Temperature coefficient of permeability<br>&nbsp;&nbsp;&nbsp;11.1 Specimens<br>&nbsp;&nbsp;&nbsp;11.2 Measuring procedure<br>12 Losses at low flux density<br>&nbsp;&nbsp;&nbsp;12.1 Object<br>&nbsp;&nbsp;&nbsp;12.2 Measuring coil<br>&nbsp;&nbsp;&nbsp;12.3 Measurement of residual and eddy current loss<br>&nbsp;&nbsp;&nbsp;12.4 Measurement of the hysteresis loss<br>13 Total harmonic distortion<br>&nbsp;&nbsp;&nbsp;13.1 Specimen<br>&nbsp;&nbsp;&nbsp;13.2 Measuring instrument and circuit<br>&nbsp;&nbsp;&nbsp;13.3 Measuring procedure<br>&nbsp;&nbsp;&nbsp;13.4 AL value and winding conditions for THDF measurement<br>&nbsp;&nbsp;&nbsp;13.5 Material characteristics - THDF<br>14 Curie temperature<br>15 Normalized impedance, parallel conductivity, and insertion<br>&nbsp;&nbsp;&nbsp;loss<br>&nbsp;&nbsp;&nbsp;15.1 General<br>&nbsp;&nbsp;&nbsp;15.2 Measuring procedure<br>&nbsp;&nbsp;&nbsp;15.3 Normalized impedance<br>&nbsp;&nbsp;&nbsp;15.4 Parallel conductivity<br>Annex A (informative) Disaccommodation<br>Annex B (informative) Measurement conditions for THD testing<br>Figures<br>Tables

Abstract

Applicable to magnetic cores, mainly made of magnetic oxides or metallic powders, used at low excitation level in inductors and transformers for telecommunication equipment and electronic devices employing similar techniques.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 51
Supersedes	IEC 60367-1 : 2.0