SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
International Electrotechnical Committee
FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Requirements<br>5 Sampling plan <br>6 Test methods<br>7 Identification, labelling, packaging, delivery condition<br>8 Measurement of Curie temperature <br>9 Measurement of lattice constant (Bond method)<br>10 Measurement of face angle by X-ray <br>11 Measurement of bulk resistivity <br>12 Visual inspections - Front surface inspection method<br>Annex A (normative) - Expression using Euler angle description <br> for piezoelectric single crystals <br>Annex B (informative) - Manufacturing process for SAW wafers<br>Bibliography
Pertains to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 49 |
| Supersedes |
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