INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
International Electrotechnical Committee
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
4.1 Measurement basics
4.2 Single pin direct power injection
4.3 Multiple pin direct power injection into pins of
differential mode systems
5 Test conditions
6 Test equipment
6.1 General
6.2 RF power source
6.3 RF power meter and directional coupler
7 Test set-up
7.1 General
7.2 Power injection set-up
7.3 Test circuit board
7.4 Characteristics of the power injection set-up
7.5 Decoupling networks
8 Test procedure
8.1 General
8.2 Specific test procedure
9 Test report
Annex A (informative) Example of a specification of immunity
levels e.g. for automotive applications
Annex B (informative) Hints for the best installation of a test
set-up with respect to RF
Annex C (informative) Constant peak test level explanation
Bibliography
Figures
Table
Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
