SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 4-3: INTERFACE INTEGRATED CIRCUITS - DYNAMIC CRITERIA FOR ANALOGUE-DIGITAL CONVERTERS (ADC)
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Characteristics
5 Measuring methods
5.1 Dynamic testing with sinusoidal signals
5.2 Dynamic tests with wideband signals
5.3 Linearity error of a linear
ADC (E[L]) (E[L(adj)]) (E[T])
5.4 Differential linearity error (E[D])
Annex A (informative) Mathematical derivations
Annex B (informative) Wideband signal generation
and analysis
Bibliography
Describes a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
