QUALITY ASSESSMENT SYSTEMS - PART 2: SELECTION AND USE OF SAMPLING PLANS FOR INSPECTION OF ELECTRONIC COMPONENTS AND PACKAGES
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Sampling system
4.1 Formation and identification of lots
4.2 Drawing of samples
4.2.1 Selection of sample items
4.2.2 Process of sampling
4.3 Sampling plans
4.3.1 Inspection level
4.3.2 Sampling plan for normal inspection
4.3.3 Acceptance number
4.3.4 Tightened or reduced inspection
5 Acceptance and rejection
5.1 Acceptability criteria
5.2 Disposition of rejected lots
6 Statistical verified quality limit (SVQL)
6.1 General
6.2 Calculation of the SVQL
Annex A (informative) Estimation of the statistical verified
quality limit (SVQL) in nonconforming items per million
(x10[-6]) at a confidence limit 60%
Annex B (informative) Relationship between this standard
and ISO 2859-1
Annex C (informative) Example of application of this standard
(lot-by-lot inspection of assessment level EZ in
IEC/TC 40)
Bibliography
Applies to the inspection of electronic components, packages, and also modules for use in electronic and electric equipment.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 91 |
