INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD
International Electrotechnical Committee
FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
5.1 General
5.2 Test equipment
5.3 Test board
6 Test procedure
6.1 Hazardous electromagnetic fields
6.2 Calibration of forward power limitation
6.3 BCI test
6.4 BCI test set-up characterization procedure
7 Test report
Annex A (informative) Examples for test levels and frequency
step selection
Annex B (informative) Example of BCI test board and set-up
Annex C (informative) Example of RF test board and set-up
Bibliography
Describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
