IEC 62529 : 2.0
IEC 62529 : 2.0
SIGNAL AND TEST DEFINITION
International Electrotechnical Committee
Specials
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IEC 60761-4 : 2.0
$78.00 (-56%) $34.32
Table of Contents
1. Overview
2. Definitions, abbreviations, and acronyms
3. Structure of this standard
4. Signals and SignalFunctions
5. SML layer
6. BSC layer
7. TSF layer
8. Test procedure language (TPL)
9. Maximizing test platform independence
Annex A (normative) - Signal modeling language (SML)
Annex B (normative) - Basic signal components (BSC) layer
Annex C (normative) - Dynamic signal descriptions
Annex D (normative) - Interface definition language
(IDL) basic components
Annex E (informative) - Test signal framework (TSF)
for C/ATLAS
Annex F (informative) - Test signal framework (TSF)
library for digital pulse classes
Annex G (normative) - Carrier language requirements
Annex H (normative) - Test procedure language (TPL)
Annex I (normative) - Extensible markup language (XML)
signal descriptions
Annex J (informative) - Support for ATLAS nouns and modifiers
Annex K (informative) - Guide for maximizing test platform
independence and test application interchangeability
Annex L (informative) - Bibliography
Annex M (informative) - IEEE List of Participants
Abstract
Gives the means to define and describe signals used in testing.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 93 |
