IEC 62341-1-1 : 1.0

Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms, definitions, units and symbols<br>4 Technical aspects<br>&nbsp;&nbsp;4.1 Order of precedence<br>&nbsp;&nbsp;4.2 Standard atmospheric conditions<br>&nbsp;&nbsp;4.3 Marking<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.1 Device identification<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.2 Device traceability<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.3 Packing<br>&nbsp;&nbsp;4.4 Categories of assessed quality<br>&nbsp;&nbsp;4.5 Screening<br>&nbsp;&nbsp;4.6 Handling<br>5 Quality assessment procedures<br>&nbsp;&nbsp;5.1 Eligibility for qualification approval<br>&nbsp;&nbsp;5.2 Primary stage of manufacture<br>&nbsp;&nbsp;5.3 Commercially confidential information<br>&nbsp;&nbsp;5.4 Formation of inspection lots<br>&nbsp;&nbsp;5.5 Structurally similar devices<br>&nbsp;&nbsp;5.6 Subcontracting<br>&nbsp;&nbsp;5.7 Validity of release<br>6 Quality approval procedure<br>&nbsp;&nbsp;6.1 Granting of qualification approval<br>&nbsp;&nbsp;6.2 Quality conformance inspection requirements<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.1 Division into groups and subgroups<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.2 Quality conformance Inspection requirements<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.3 Supplementary procedure for reduced inspection<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.4 Sampling requirements for small lots<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.5 Certified records of released lots (CRRL)<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.6 Delivery of devices subjected to destructive <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;or non-destructive test<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.7 Delayed deliveries<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2.8 Supplementary procedure for deliveries<br>&nbsp;&nbsp;6.3 Statistical sampling procedures<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.3.1 AQL sampling plans<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.3.2 LTPD sampling plans<br>&nbsp;&nbsp;6.4 Endurance tests<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.4.1 General<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.4.2 Endurance tests where the failure rate is specified<br>&nbsp;&nbsp;6.5 Accelerated test procedures<br>7 Capability approval procedure<br>8 Test and measurement procedures<br>&nbsp;&nbsp;8.1 Standard environmental conditions<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.1.1 Dark room condition<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.1.2 Standard setup condition<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.1.3 Standard atmospheric conditions for measurements<br>&nbsp;&nbsp;8.2 Physical examination<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.2.1 Visual examination<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.2.2 Dimensions<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.2.3 Weight<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.2.4 Permanence of marking<br>&nbsp;&nbsp;8.3 Electrical and optical measurement<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;8.3.1 General conditions and precautions<br>&nbsp;&nbsp;8.4 Environmental test<br>&nbsp;&nbsp;8.5 Endurance test<br>Annex A (informative) - Lot tolerance percentage defective<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;(LTPD) sampling plans<br>Bibliography

Abstract

Describes general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 110