IEC 62416 : 1.0

Table of Contents

FOREWORD<br>1 Scope<br>2 Abbreviations and letter symbols<br>3 Test structures<br>4 Stress time<br>5 Stress conditions<br>6 Sample size<br>7 Temperature<br>8 Failure criteria<br>9 Lifetime estimation method<br>10 Lifetime requirements<br>11 Reporting<br>Bibliography

Abstract

Specifies the wafer level hot carrier test on NMOS and PMOS transistors.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47