IEC 62415 : 1.0

IEC 62415 : 1.0

SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>1 Scope<br>2 Symbols, terms and definitions<br>3 Background<br>4 Sample size<br>5 Test structures<br>6 Test conditions<br>7 Failure criteria<br>8 Data analysis<br>Bibliography

Abstract

Offers a method for conventional constant current electromigration testing of metal lines, via string and contacts.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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