IEC 62415 : 1.0
IEC 62415 : 1.0
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
International Electrotechnical Committee
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
International Electrotechnical Committee
FOREWORD<br>1 Scope<br>2 Symbols, terms and definitions<br>3 Background<br>4 Sample size<br>5 Test structures<br>6 Test conditions<br>7 Failure criteria<br>8 Data analysis<br>Bibliography
Offers a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 47 |