IEC 62475 : 1.0
IEC 62475 : 1.0
HIGH-CURRENT TEST TECHNIQUES - DEFINITIONS AND REQUIREMENTS FOR TEST CURRENTS AND MEASURING SYSTEMS
International Electrotechnical Committee
HIGH-CURRENT TEST TECHNIQUES - DEFINITIONS AND REQUIREMENTS FOR TEST CURRENTS AND MEASURING SYSTEMS
International Electrotechnical Committee
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Procedures for qualification and use of a measuring
system
5 Tests and test requirements for an approved measuring
system
6 Steady-state direct current
7 Steady-state alternating current
8 Short-time direct current
9 Short-time alternating current
10 Impulse currents
11 Current measurement in high-voltage dielectric testing
12 Reference measuring systems
Annex A (informative) - Uncertainty of measurement
Annex B (informative) - Examples of the uncertainty
calculation in high-current measurements
Annex C (informative) - Step-response measurements
Annex D (informative) - Convolution method for estimation
of dynamic behaviour from step-response measurements
Annex E (informative) - Constraints for certain wave
shapes
Annex F (informative) - Temperature rise of measuring
resistors
Annex G (informative) - Determination of r.m.s. values
of short-time a.c. current
Annex H (informative) - Examples of IEC standards with
high current tests
Bibliography
Applies to high-current testing and measurements on both high-voltage and low-voltage equipment.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 42 |