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IEC 60747-14-4 : 1.0

IEC 60747-14-4 : 1.0

SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terminology and letter symbols <br>4 Essential ratings and characteristics<br>5 Measuring methods<br>6 Acceptance and reliability<br>Annex A (informative) - Definition of sensitivity matrix of <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;an accelerometer <br>Annex B (informative) - Dynamic linearity measurement using <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;an impact acceleration generator <br>Annex C (informative) - Measurement of peak sensitivity<br>Bibliography

Abstract

Pertains to semiconductor accelerometers for all types of products.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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