IEC 60747-14-4 : 1.0
IEC 60747-14-4 : 1.0
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS
International Electrotechnical Committee
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS
International Electrotechnical Committee
FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terminology and letter symbols <br>4 Essential ratings and characteristics<br>5 Measuring methods<br>6 Acceptance and reliability<br>Annex A (informative) - Definition of sensitivity matrix of <br> an accelerometer <br>Annex B (informative) - Dynamic linearity measurement using <br> an impact acceleration generator <br>Annex C (informative) - Measurement of peak sensitivity<br>Bibliography
Pertains to semiconductor accelerometers for all types of products.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 47 |