SUPERCONDUCTIVITY - PART 15: ELECTRONIC CHARACTERISTIC MEASUREMENTS - INTRINSIC SURFACE IMPEDANCE OF SUPERCONDUCTOR FILMS AT MICROWAVE FREQUENCIES
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test Report
Annex A (informative) - Additional information relating
to clauses 1 to 8
Annex B (informative) - Uncertainty considerations
Bibliography
Defines measurements of the intrinsic surface impedance (Z[s]) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 90 |
