CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 16-21: MECHANICAL TESTS ON CONTACTS AND TERMINATIONS - TEST 16U: WHISKER TEST VIA THE APPLICATION OF EXTERNAL MECHANICAL STRESSES
International Electrotechnical Committee
FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test equipment
5 Preparation of the specimens
6 Measurement of whisker length
7 Test method
8 Requirements
9 Information to be recorded
10 Details to be specified
Annex A (informative) - Whisker growth due to
mechanical stresses induced by
assembly processes and intended
usage
Specifies a standard test method to assess the possibility of whisker growth by external mechanical stress on the tin and tin-alloy plated parts of a connector in its application (after wire termination, after soldering, after mounting, mated with counterpart).
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 48 |
