IEC TS 62098 : 1ED 2000

Table of Contents

FOREWORD<br>INTRODUCTION<br>Clause<br>1 General<br>&nbsp;&nbsp;1.1 Scope<br>&nbsp;&nbsp;1.2 Normative references<br>&nbsp;&nbsp;1.3 Definitions<br>2 Developments in instrumentation<br>3 Evaluation considerations<br>&nbsp;&nbsp;3.1 System approach<br>&nbsp;&nbsp;3.2 Evaluation matrix<br>&nbsp;&nbsp;3.3 Boundary area (interfaces)<br>4 Evaluation technology<br>&nbsp;&nbsp;4.1 Instrument analysis<br>&nbsp;&nbsp;4.2 Instruments on a digital communication link<br>&nbsp;&nbsp;4.3 Identification of instrument properties<br>&nbsp;&nbsp;4.4 Influencing conditions and related tests<br>Annex A (normative) Considerations on measuring<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;accuracy<br>Annex B (informative) Offset measurements of controllers<br>Annex C (informative) Resolution and loss of integral<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;action<br>Annex D (informative) Reset wind-up protection<br>Annex E (informative) Practical example of evaluation<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;matrix

Abstract

Aims at providing background information for developing evaluation methods for microprocessor-based instruments. Depending on the application of an instrument, the user may have to define further functions and properties or influencing conditions.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 65