IEC 61788-17 : 1ED 2013

IEC 61788-17 : 1ED 2013

SUPERCONDUCTIVITY - PART 17: ELECTRONIC CHARACTERISTIC MEASUREMENTS - LOCAL CRITICAL CURRENT DENSITY AND ITS DISTRIBUTION IN LARGE-AREA SUPERCONDUCTING FILMS

International Electrotechnical Committee

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Table of Contents

FOREWORD
INTRODUCTION
1 Scope
2 Normative reference
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty in the test method
8 Test report
Annex A (informative) - Additional information
        relating to Clauses 1 to 8
Annex B (informative) - Optional measurement systems
Annex C (informative) - Uncertainty considerations
Annex D (informative) - Evaluation of the uncertainty
Bibliography

Abstract

Defines the measurements of the local critical current density (J[c]) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 90

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