INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY - PART 3: NON-SYNCHRONOUS TRANSIENT INJECTION METHOD
International Electrotechnical Committee
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 General<br>5 Coupling networks<br>6 IC configuration and evaluation<br>7 Test conditions<br>8 Test equipment<br>9 Test set up<br>10 Test procedure<br>11 Test report <br>Annex A (informative) - Test board recommendations <br>Annex B (informative) - Selection hints for coupling <br> and decoupling network values<br>Annex C (informative) - Industrial and consumer <br> applications <br>Annex D (informative) - Vehicle applications
Defines a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
