IEC 62483 : 1ED 2013

Table of Contents

1 Scope<br>2 Terms and definitions<br>3 Test method for measuring tin whisker <br>&nbsp;&nbsp;growth<br>4 Acceptance procedure for tin and tin alloy <br>&nbsp;&nbsp;surface finishes<br>5 Acceptance criteria<br>6 Reporting of results<br>7 On-going tin whisker evaluation<br>Annex A (normative) - Test method for measuring <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;whisker growth on tin and tin alloy<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;surface finishes of semiconductor devices<br>Bibliography

Abstract

Specifies the methodology applicable for environmental acceptance testing of tin-based surface finishes and mitigation practices for tin whiskers on semiconductor devices.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47
Supersedes	IEC PAS 62483 : 1.0