INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 General
5 Test Conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
Annex A (informative) - Calibration of
near-field probes
Annex B (informative) - Electric and magnetic
field probes
Annex C (informative) - Coordinate systems
Bibliography
Gives a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC).
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
