DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Test conditions and sample preparation
5 TEG
Bibliography
Defines the test element group devices useful when measuring basic properties of device embedded substrates.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 91 |
