TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 2-721: TEST METHODS FOR MATERIALS FOR INTERCONNECTION STRUCTURES - MEASUREMENT OF RELATIVE PERMITTIVITY AND LOSS TANGENT FOR COPPER CLAD LAMINATE AT MICROWAVE FREQUENCY USING SPLIT POST DIELECTRIC RESONATOR
International Electrotechnical Committee
FOREWORD
1 Scope
2 Test specimens
3 Equipment/apparatus
4 Procedure
5 Report
6 Additional information
Annex A (informative) - Example of test fixture and
test result
Annex B (informative) - Additional information on
K[varepsilon] (varepsilon[gamma], h) and p[es]
Bibliography
Specifies way to determine the relative permittivity (varepsilon[gamma]) and loss tangent (tan[delta]) (also called dielectric constant (Dk) and dissipation factor (Df) of copper clad laminates at microwave frequencies (from 1, 1 GHz to 20 GHz) using a split post dielectric resonator (SPDR)
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 91 |
