IEC 62878-1-1 : 1ED 2015
IEC 62878-1-1 : 1ED 2015
DEVICE EMBEDDED SUBSTRATE - PART 1-1: GENERIC SPECIFICATION - TEST METHODS
International Electrotechnical Committee
DEVICE EMBEDDED SUBSTRATE - PART 1-1: GENERIC SPECIFICATION - TEST METHODS
International Electrotechnical Committee
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Test methods
5 Shipping inspection
Annex A (informative) - Related test methods
Bibliography
Defines the test methods of passive and active device embedded substrates.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 91 |