WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and [sigma][i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of Equation (4) for R[i]
Annex B (informative) - Calculation uncertainty of parameters
Bibliography
Specifies a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 49 |
| Supersedes |
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